The Continuum® series represents the next generation of electron energy loss spectroscopy (EELS) and energy-filtered transmission electron microscopy (EFTEM) systems from Gatan. By focusing on simplifying the operation of energy-loss systems without sacrificing any of the power or flexibility, the Continuum series enables new levels of productivity and data throughput. Built around new and exclusive detector systems, the Continuum delivers outstanding detector speed and quality for both EELS and EFTEM applications.
>10x higher productivity
- >8000 spectra per second at >95% duty cycle
- >10x faster system tuning
- Streamlined, workflow-based user interface
Revolutionary data quality
- Low-noise, high dynamic range CMOS detector
- Improved MTF and DQE from new XCR™ sensor stack technology
- Full gain correction in all acquisition modes
- Exclusive dynamic focus control
- Choose the K3® electron counting direct detector for the ultimate EELS and EFTEM data quality
Emerging applications
- Energy-filtered 4D STEM*
- In-situ EELS and EFTEM*
- Momentum-resolved EELS*
*Requires optional components
Models 1065, 1066, 1069, 1069HR, 1077
Datasheets
Detecting weak core-loss signals with dose-fractionated spectrum imaging
Instant elemental and valence mapping with GIF Continuum using internal standards
Using EELS to reveal ferric iron content from a Chang’e-5 lunar surface sample
High-speed composition and chemical analysis of nanoelectronic materials with GIF Continuum
High-speed composition and chemical analysis of Si/STO/PZT with GIF Continuum
Atomic-level EELS mapping using high energy edges in DualEELS™ mode
High speed EELS composition analysis, in DualEELS mode, of metal alloy ohmic contacts for the fabrication of III-V MOSFET devices
Fast simultaneous acquisition of low- and core-loss regions in the EELS spectrum from catalyst particles containing the heavy metals Au and Pd using the GIF Quantum® system
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