Analysis of the changes in local carbon structure caused by self-implantation of carbon into diamond and chemistry.
Methods
Probe-corrected JEOL ARM 200 TEM/STEM microscope; S-FEG emission gun; GIF Quantum® ER system; voltage: 200 kV; STEM mode; EELS low-loss spectrum (0 – 500 eV) exposure time: 0.12 ms; EELS core-loss spectrum (300 – 2300 eV) exposure time: 12 ms ; convergence angle: 28 mrad; collection angle: 45 mrad; total exposure time: <5 min